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Das Entstehen des Elektronenmikroskops und der Elektronenmikroskopie (Nobel-Vortrag) = Le développement du microscope électronique et de la microscopie électronique (lecture Nobel) = The development of the electron microscope and of electron microscopy (Nobel Lecture)RUSKA, E.Angewandte Chemie. 1987, Vol 99, Num 7, pp 611-621, issn 0044-8249Article

Reflections on the making of early electron microscopes in ChinaHUANG, L. Y.Optik (Stuttgart). 1992, Vol 92, Num 1, pp 23-26, issn 0030-4026Article

Distribution of projection angles for single-axis-tilt electron microscope tomography of extended thin planar specimensLEVY, H. A; OLINS, A. L; OLINS, D. E et al.Journal of microscopy (Print). 1992, Vol 165, pp 325-330, issn 0022-2720, 2Article

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Simple method for determining the absolute sense of image rotation in a transmission electron microscopeNAKAHARA, S; CULLIS, A. G.Ultramicroscopy. 1992, Vol 45, Num 3-4, pp 365-370, issn 0304-3991Article

Vacuole formation in wheat starchy endospermBECHTEL, D. B; FREND, A; KALEIKAU, L. A et al.Food microstructure. 1989, Vol 8, Num 2, pp 183-190, issn 0730-5419, 8 p.Article

Theory of the point source electron microscopeKREUZER, H. J; NAKAMURA, K; WIERZBICKI, A et al.Ultramicroscopy. 1992, Vol 45, Num 3-4, pp 381-403, issn 0304-3991Article

Performance of image converters using slow-scan CCDs in MeV electron microscopyHERRMANN, K.-H; LIU, L.Optik (Stuttgart). 1992, Vol 92, Num 1, pp 48-50, issn 0030-4026Article

Improving the dynamic response of magnetic electron lensesTHONG, J. T. L; BRETON, B. C.Measurement science & technology (Print). 1991, Vol 2, Num 11, pp 1116-1118, issn 0957-0233Article

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Metachromatic staining and electron dense reaction of glycosaminoglycans by means of cuprolinic blueJUARRANZ, A; FERRER, J. M; TATO, A et al.Histochemical journal. 1987, Vol 19, Num 1, pp 1-6, issn 0018-2214Article

Electronmicroscopic examination of corroded aluminum-copper alloy foils = Examen au microscope électronique de feuilles corrodées d'alliage aluminium-cuivreJUNG, D. Y; DUMLER, I; METZGER, M et al.Journal of the Electrochemical Society. 1985, Vol 132, Num 10, pp 2308-2312, issn 0013-4651Article

Frequency dependence of inductance fue to slow flux penetration into magnetic circuit of LensNISHI, R; TAKAOKA, A; URA, K et al.Journal of electron microscopy. 1993, Vol 42, Num 1, pp 31-34, issn 0022-0744Article

Microstructural development in a model austenitic alloy following electron and ion irradiationSAKAGUCHI, N; KINOSHITA, H; WATANABE, S et al.Journal of nuclear materials. 2008, Vol 382, Num 2-3, pp 197-202, issn 0022-3115, 6 p.Conference Paper

Diffraction imaging and diffuse scattering by small dislocation loopsZHOU, Z; DUDAREV, S. L; JENKINS, M. L et al.Journal of nuclear materials. 2007, Vol 367-370, pp 305-310, issn 0022-3115, 6 p., aConference Paper

A simulation model for cathodoluminescence in the scanning electron microscopePHANG, J. C. H; KIN LEONG PEY; CHAN, D. S. H et al.I.E.E.E. transactions on electron devices. 1992, Vol 39, Num 4, pp 782-791, issn 0018-9383Article

Electron optical properties of a cathode lensLENC, M; MÜLLEROVA, I.Ultramicroscopy. 1992, Vol 41, Num 4, pp 411-417, issn 0304-3991Article

On the interpretation of spurious reflections in optical diffraction patterns of high resolution electron microscopy imagesCASTANO, V. M; PEREZ-CAMPOS, R; JOSE-YACAMAN, M et al.Optik (Stuttgart). 1992, Vol 91, Num 3, pp 127-130, issn 0030-4026Article

Some results obtained by a newly constructed ultra-high-resolution 1300 kV electron microscopeMATSUI, Y; HORIUCHI, S; BANDO, Y et al.Japanese journal of applied physics. 1991, Vol 30, Num 1A, pp L64-L66, issn 0021-4922, 2Article

Approximation of missing-cone data in 3D electron microscopyBARTH, M; BRYAN, R. K; HEGERL, R et al.Ultramicroscopy. 1989, Vol 31, Num 4, pp 365-378, issn 0304-3991Article

VG microscopes' ultra-high resolution lensMULVEY, T.TIZ-Fachberichte. 1989, Vol 113, Num 10, pp 800-801, issn 0170-0146Article

Scaling low of voltage contrast in scanning electron microscopeURA, K.Journal of electron microscopy. 1988, Vol 37, Num 2, pp 54-57, issn 0022-0744Article